Proceedings of the Estonian Academy of Sciences, Engineering |
Common terms and phrases
algorithms analytical solution application approach Baltic Electronics Conference boundary conditions centre-voxel formulation Coordinate core Ck core-based system corner-voxel formulation COSTM current density deterministic test patterns deterministic test sequence deterministic test set discretization eigenvalues electric field strength Electrical Impedance Tomography electrode emitter emulation environment energy eigenvalues epitaxial epitaxial layer Estonian EWC method fault coverage fault dropping fault injection fault simulation FDM formulations FGH method FPGA grid nodes grid points hardware hybrid BIST architecture hybrid test set implemented individual core iteration JBS device Kurel LFSR linear logic matrix memory constraints mesh minimization numerical methods optimization parameters potential distribution preconditioner problems Proc pseudorandom and deterministic pseudorandom test patterns pseudorandom test sequence resolution Schottky contact Schottky diode Schrodinger equation self-test semiconductor sequential circuits shooting method solving structure test architecture test vectors Total test length Turbo Tester turn-off characteristics Ubar values voxels wave function