Proceedings of the Estonian Academy of Sciences, Engineering |
Common terms and phrases
activated path Afcp algorithm analysis angle enlargement angle error BAFA behaviour binary decision diagrams Boolean derivatives C-face calculated charge pump Chebyshev CMOS coefficients complex gate computed considered corresponding defect coverage defektide delay Design diffusion welding digital circuits dynamic EBAFA EFS formula Estonian Estonian Science example exponential fault coverage fault model fault simulation Fourier frequency convergence frequency error estimation functional fault model fundamental frequencies gate-level given hierarchical IEEE Trans input pattern input signal ISCAS'85 benchmarks Kukk Leo Motus linear logical conditions lower level faults method module non-linear oscillator Pade parameters periodic components phase frequency detector phase-locked loop physical defects Proc pulses Raimund Ubar real-time resonator groups Schottky shown in Fig SSBDD stack structure stuck-at fault subcircuits Tallinn Technical University Tdel terminal node test pattern time-step transfer characteristic transients transition variable vector conditioning waveforms zero crossing